Manhas, Sanjeev
S.K. Manhas
Professor
sanjeev.manhas@ece.iitr.ac.in
+91-1332-285147
Areas of Interest
- Nanoscale Devices and Circuits:, Nanowire MOSFET Modeling and Circuit Design, Memories:, NVM and AI Applications, 3D NAND, nanoscale DRAM , MEMs:, MEMS Based Sensors and Energy Harvesting, Reliability:, CMOS Reliability- BTI, TDDB, Sensors:, CNT Based Sensors, Novel ISFET Devices, Nanofabrication:, Nanoscale CMOS Process and VLSI Technologies
Professional Background
| From | To | Position | Organisation |
|---|---|---|---|
| 2019-01-01 | Ongoing | Professor | IIT Roorkee |
| 2014-01-01 | 2019-01-01 | Associate Professor | IIT Roorkee |
| 2008-01-01 | 2014-01-01 | Assistant Professor | IIT Roorkee |
| 2007-01-01 | 2008-01-01 | Senior Research Engineer | Institute of Microelectronics, Singapore |
| 2003-01-01 | 2007-01-01 | Member Technical Staff | Micron Technology, Singapore/USA |
Multiple Posts
| From | To | Position | Organisation |
|---|---|---|---|
| 2020-08-31 | Ongoing | Faculty-in-Charge TIDES Business Incubator IIT Roorkee | Indian Institute of Technology, Roorkee |
| 2015-01-01 | 2019-01-01 | Faculty-in-Charge, TIDES Business Incubator | IIT Roorkee |
| 2020-08-31 | Ongoing | Faculty-in-Charge STEP IIT Roorkee | Indian Institute of Technology, Roorkee |
| 2015-01-01 | 2017-01-01 | Chairman, Departmental Faculty Research Committee | IIT Roorkee |
| 2016-01-01 | 2018-01-01 | Chairman, Departmental Academic Programme Committee (DAPC) | IIT Roorkee |
| 2015-01-01 | 2019-01-01 | Faculty-in-Charge, STEP | IIT Roorkee |
Educational Details
| Degree | Subject | University | Year |
|---|---|---|---|
| Ph. D. | Electronics and Electrical Engineering | De Montfort University, Leicester, UK | 2003 |
| M. Tech. | Solid State Technology | IIT Madras | 1996 |
Sponsored Research Projects
| Topic | Funding Agency | Start Date | Period |
|---|---|---|---|
| Non-filamentary three-Terminal Memristor Architecture for Bio-mimetic and Logic Design | MHRD (SPARC) | 2019-01 | 1 year 8 months |
| FeFET TCAD for Interface Engineering | Applied Materials, USA | 2019-01 | 1 year 8 months |
| TCAD for DRAM and 3D NAND | Applied Materials, USA | 2018-01 | 2 years 8 months |
| DIC PhD Fellowship | DIC | 2018-01 | 2 years 8 months |
| Implementation of TIDE Scheme for Entrepreneurship Development | MeitY | 2015-01 | 5 years 8 months |
| Scheme of Financial Assistance for Setting up of Electronics and ICT Academies, DeitY | MeitY | 2016-01 | 4 years 8 months |
| Establishment of Technology Business Incubator at IIT Roorkee | DST | 2017-01 | 3 years 8 months |
| FIST (Profilometer and PECVD systems for Microelectronics Lab) | DST | 2016-01 | 4 years 8 months |
| Investigation of Silicon Nanowire FET Reliability and its Modeling | DST | 2012-01 | 8 years 7 months |
| Development of Microfluidics Based Device to Detect CTCs | SMILE | 2017-01 | 3 years 8 months |
| Design and Development of Carbon Nanotubes Based Chemical Sensor | DRDO | 2011-01 | 9 years 7 months |
| Si Nanowire CMOS for Ultra High Density Circuits | FIG | 2009-01 | 11 years 7 months |
Memberships
- IEEE Electron Device Society, Member
- IEEE Solid State Circuits Society, Member
Teaching Engagements
| Title | Course Code | Class Name | Semester |
|---|---|---|---|
| Fundamentals of Microelectronics | EC 344 | UG | Spring |
| Analog Circuits | EC 205 | UG | Autumn |
| Semiconductor Devices | EC242 | UG | Autumn |
| Analog Electronics | EC 205 | UG | Autumn |
| Fundamentals of Electronics | EC 102 | UG | Autumn |
| MOS Device Physics | EC 571 | PG | Autumn |
| VLSI Technology | EC 555 | PG | Spring |
| Nanoscale Transistors | EC 587 | PG | Spring |
| Digital Circuits | EC 203 | UG | Autumn |
| Compound Semiconductor Devices | EC 559 | PG | Spring |
| Technology of Nanostructured Fabrication | NT 511 | PG | Autumn |
PHDs Supervised
| Topic | Scholar Name | Status of PHD | Registration Date |
|---|---|---|---|
| Analysis of Si-nanowire GAA MOSFET and its Implementation in Logic Design | Gaurav Kaushal | O | 2008-01 |
| Performance Models for Nanoscale VLSI Circuits | Baljit Kaur | O | 2009-01 |
| Vertical Nanowire Based CMOS Circuit Design | Maheshwaram Satish | O | 2010-01 |
| Carbon Nanotube Interconnects for VLSI | Manoj Kumar Majumder | O | 2010-01 |
| Concurrent Multi-band Oscillators for Multifunctional Wireless Systems | L Snehalatha | O | 2011-01 |
| Silicon Nanowire Based Circuit Design and NBTI Reliability | Om Prakash | O | 2013-01 |
| Fabrication and Characterization of Vibrational Energy Harvesters | Sandeep Singh Chauhan | O | 2013-01 |
| Carbon Nanotube Devices for Sensor Applications | Narendra Kumar | O | 2014-01 |
| Charge Trap Based SONOS/MONOS Devices for 3D NAND Flash Memory Applications | Upendra Mohan Bhatt | O | 2014-01 |
| Design, Analysis and Optimization of DRAM Transistor | Satendra Kumar Guatam | O | 2015-01 |
| Reliability of Gallium-Nitride Based High Electron Mobility Transistors and Circuits | Sourabh Jindal | O | 2015-01 |
| Nanomaterials Based Biosensors for detection of pathogens and Small Molecules | Pardeep Kumar | O | 2015-01 |
Refereed Journal Papers
Selected Publications
- N. Kumar, N. K. Navani, and S. K. Manhas, “Altering the Schottky Barrier Height and Conductance by Using Metal Nanoparticles in Carbon Nanotubes-Based Devices,” IEEE Trans. Electron Devices, vol. 66, no. 6, pp. 2789–2794, 2019, doi: 10.1109/TED.2019.2908526.
- S. K. Gautam, S. K. Manhas, A. Kumar, M. Pakala and E. Yieh, "Row Hammering Mitigation Using Metal Nanowire in Saddle Fin DRAM," in IEEE Transactions on Electron Devices (Published , July 2019.) doi: 10.1109/TED.2019.2931347
- Sandeep Singh Chauhan, M.M Joggler, S.K. Manhas, "High Power Density CMOS Compatible Micro- machined MEMs Energy Harvester" IEEE Sensor Journal, (Published as an early access in IEEE explore, June 2019.)
- S. K. Gautam, A. Kumar, and S. K. Manhas, "Improvement of Row Hammering Using Metal Nanoparticles in DRAM—A Simulation Study,” IEEE Electron Device Letters, vol. 39, pp. 1286-1289, 2018.
- S. S. Chauhan, M. Joglekar, and S. K. Manhas, "Influence of Process Parameters and Formation of Highly c-Axis Oriented AlN Thin Films on Mo by Reactive Sputtering," IEEE/TMS Journal of Electronics Material, Vol. 47, no. 12, pp-7520-7530, 2018.
- S. S. Chauhan, M. Joglekar, and S. K. Manhas, "Fabrication of Cantilever MEMs structure of C-axis Grown AlN film for Energy Harvester Application," Proc EEE International Conference on Industrial Technology (ICIT), Lyon, France, vol. 300, p. 200, 2018.
- U. M. Bhatt, A. Kumar, and S. K. Manhas, "Performance Enhancement by Optimization of Poly Grain Size and Channel Thickness in a Vertical Channel 3-D NAND Flash Memory," IEEE Transactions on Electron Devices, vol. 65, pp. 1781-1786, 2018.
- O. Prakash, S. Maheshwaram, M. Sharma, A. Bulusu, and S. K. Manhas, "Performance and Variability Analysis of SiNW 6T-SRAM Cell Using Compact Model With Parasitics,” IEEE Transactions on Nanotechnology, vol. 16, pp. 965-973, 2017.
- O. Prakash, S. Beniwal, S. Maheshwaram, A. Bulusu, N. Singh, and S. Manhas, "Compact NBTI Reliability Modeling in Si Nanowire MOSFETs and Effect in Circuits," IEEE Transactions on Device Materials Reliability, vol. 17, pp. 404-413, 2017.
- A. Pandey, H. Kumar, S. Manhas, S. Dasgupta, and B. Anand, "Atypical Voltage Transitions in FinFET Multistage Circuits: Origin and Significance," IEEE Transactions on Electron Devices, vol. 63, pp. 1392-1396, 2016.
- A. Joshi, S. Manhas, S. K. Sharma, and S. Dasgupta, "An 8 bit, 100 kS/s, switch-capacitor DAC SAR ADC for RFID applications," Microelectronics Journal, vol. 46, pp. 453-461, 2015.
- R. Shankar, G. Kaushal, S. Maheshwaram, S. Dasgupta, and S. Manhas, "A degradation model of double gate and gate-all-around MOSFETs with interface trapped charges including effects of channel mobile charge carriers," J IEEE transactions on Device Materials Reliability, vol. 14, pp. 689-697, 2014.
- A. Pandey, S. Raycha, S. Maheshwaram, S. K. Manhas, S. Dasgupta, A. K. Saxena, and B. Anand, "Effect of load capacitance and input transition time on FinFET inverter capacitances," J IEEE Transactions on Electron Devices, vol. 61, pp. 30-36, 2014.
- M. K. Majumder, B. K. Kaushik, and S. K. Manhas, "Analysis of delay and dynamic crosstalk in bundled carbon nanotube interconnects," IEEE Transactions on Electromagnetic Compatibility, vol. 56, pp. 1666-1673, 2014.
- A. Kumar, V. Kumar, S. Agarwal, A. Basak, N. Jain, A. Bulusu, and S. Manhas, "Nitrogen-terminated semiconducting zigzag GNR FET with negative differential resistance," IEEE Transactions on Nanotechnology, vol. 13, pp. 16-22, 2014.
- G. Kaushal, S. Manhas, S. Maheshwaram, B. Anand, S. Dasgupta, and N. Singh, "Novel Design Methodology Using Lext Sizing in Nanowire CMOS Logic," IEEE Transactions on Nanotechnology, vol. 13, pp. 650-658, 2014.
- B. Kaur, N. Alam, S. Manhas, and B. Anand, "Efficient ECSM Characterization Considering Voltage, Temperature, and Mechanical Stress Variability," IEEE Trans. on Circuits Systems, vol. 61, pp. 3407-3415, 2014.
- N. Jain, S. Manhas, A. Aggarwal, and P. Chaudhry, "Effect of metal contact on CNT based sensing of NO2 molecules," in Physics of Semiconductor Devices, ed: Springer, Cham, 2014, pp. 637-639.
- S. Maheshwaram, S. Manhas, G. Kaushal, B. Anand, and N. Singh, "Vertical nanowire CMOS parasitic modeling and its performance analysis," IEEE Transactions on Electron Devices, vol. 60, pp. 2943-2950, 2013.
- M. K. Majumder, N. D. Pandya, B. Kaushik, and S. Manhas, "Analysis of MWCNT and bundled SWCNT interconnects: Impact on crosstalk and area," IEEE Electron Device Letters, vol. 33, pp. 1180-1182, 2012.
- S. Maheshwaram, S. Manhas, G. Kaushal, B. Anand, and N. Singh, "Device circuit co-design issues in vertical nanowire CMOS platform," IEEE Electron Device Letters, vol. 33, pp. 934-936, 2012.
- G. Kaushal, S. Manhas, S. Maheshwaram, S. Dasgupta, B. Anand, and N. Singh, "Tuning source/drain extension profile for current matching in nanowire CMOS logic," IEEE Transactions on Nanotechnology, vol. 11, pp. 1033-1039, 2012.
- S. Manhas, N. Singh, and G. Lo, "Barrier layer thickness analysis for reliable copper plug process in CMOS technology," J Microelectronics Reliability, vol. 51, pp. 1365-1371, 2011.
- S. Maheshwaram, S. Manhas, G. Kaushal, B. Anand, and N. Singh, "Vertical silicon nanowire gate-all-around field effect transistor based nanoscale CMOS," IEEE Electron Device Letters, vol. 32, pp. 1011-1013, 2011.
- N. Singh, K. D. Buddharaju, S. Manhas, A. Agarwal, S. C. Rustagi, G. Lo, N. Balasubramanian, and D.-L. Kwong, "Si, SiGe nanowire devices by top–down technology and their applications," IEEE Transactions on Electron Devices, vol. 55, pp. 3107-3118, 2008.
- M. M. De Souza, S. Manhas, D. C. Sekhar, A. Oates, and P. Chaparala, "Influence of mobility model on extraction of stress dependent source–drain series resistance," Microelectronics Reliability, vol. 44, pp. 25-32, 2004.
- G. Cao, S. Manhas, E. S. Narayanan, M. De Souza, and D. Hinchley, "Comparative study of drift region designs in RF LDMOSFETs," IEEE Transactions on Electron Devices, vol. 51, pp. 1296-1303, 2004.
- S. Manhas, D. C. Sehkar, A. Oates, and M. M. De Souza, "Characterisation of series resistance degradation through charge pumping technique," Microelectronics Reliability, vol. 43, pp. 617-624, 2003.
- S. Manhas, M. M. De Souza, and A. S. Oates, "Quantifying the nature of hot carrier degradation in the spacer region of LDD nMOSFETs," IEEE transactions on device materials reliability, vol. 1, pp. 134-143, 2001.
- M. M. De Souza, J. Wang, S. Manhas, E. S. Narayanan, and A. Oates, "A comparison of early stage hot carrier degradation behaviour in 5 and 3 V sub-micron low doped drain metal oxide semiconductor field effect transistors," Microelectronics Reliability, vol. 41, pp. 169-177, 2001.
- S. Manhas, D. C. Sekhar, A. Oates, and M. De Souza, "Nature of hot carrier damage in spacer oxide of LDD n-MOSFETs," in Microelectronics, 2002. MIEL 2002. 23rd International Conference on, 2002, pp. 735-739.
- S. Manhas, M. De Souza, A. Oates, and Y. Chen, "Impact of oxide degradation on universal mobility behaviour of n-MOS inversion layers," in Physical and Failure Analysis of Integrated Circuits, 2002. IPFA 2002. Proceedings of the 9th International Symposium on the, 2002, pp. 227-231.
- S. Manhas, M. De Souza, A. Gates, S. Chetlur, and E. S. Narayanan, "Early stage hot carrier degradation of state-of-the-art LDD N-MOSFETs," in Reliability Physics Symposium, 2000. Proceedings. 38th Annual 2000 IEEE International, 2000, pp. 108-111.
- S. Maheshwaram, O. Prakash, M. Sharma, A. Bulusu, and S. Manhas, "Vertical Nanowire FET Based Standard Cell Design Employing Verilog-A Compact Model for Higher Performance," in International Symposium on VLSI Design and Test, 2017, pp. 239-248.
- O. Prakash, S. Maheshwaram, M. Sharma, A. Bulusu, A. Saxena, and S. Manhas, "A unified Verilog-A compact model for lateral Si nanowire (NW) FET incorporating parasitics for circuit simulation," in 2016 20th International Symposium on VLSI Design and Test (VDAT), 2016, pp. 1-6.
- S. Gautam, S. Maheshwaram, S. Manhas, A. Kumar, S. Sherman, and S. H. Jo, "Reduction of GIDL Using Dual Work-Function Metal Gate in DRAM," in Memory Workshop (IMW), 2016 IEEE 8th International, 2016, pp. 1-4.
- M. Sharma, S. Maheshwaram, O. Prakash, A. Bulusu, A. Saxena, and S. Manhas, "Compact model for vertical silicon nanowire based device simulation and circuit design," in SoC Design Conference (ISOCC), 2015 International, 2015, pp. 107-108.
- S. Maheshwaram, S. Manhas, and B. Anand, "Vertical nanowire transistor-based CMOS: VTC analysis," in Emerging Electronics (ICEE), 2014 IEEE 2nd International Conference on, 2014, pp. 1-4.
- S. Maheshwaram, S. Manhas, G. Kaushal, and B. Anand, "Vertical nanowire MOSFET parasitic resistance modeling," in Electron Devices and Solid-State Circuits (EDSSC), 2013 IEEE International Conference of, 2013, pp. 1-2.
- G. Kaushal, S. Maheshwaram, S. Dasgupta, and S. Manhas, "Drive matching issues in multi gate CMOS inverter," in Signal Processing and Communication (ICSC), 2013 International Conference on, 2013, pp. 349-354.
- H. Zhao, S. Rustagi, N. Singh, F.-J. Ma, G. Samudra, K. Budhaaraju, S. Manhas, C. Tung, G. Lo, and G. Baccarani, "Sub-femto-farad capacitance-voltage characteristics of single channel gate-all-around nano wire transistors for electrical characterization of carrier transport," in Electron Devices Meeting, 2008. IEDM 2008. IEEE International, 2008, pp. 1-4.
- S. K. Manhas, M Chen, K D Buddharaju, H Y Li, R Murthy, S Balakumar, N singh, G Q Lo and D L Kwong, “Copper Plug Barrier Process Optimization for Reliable Transistor Performance,” International Symp on Solid State Circuits and Materials (SSDM 2008), 23 - 26 Sep, p. 390, 2008, Japan
- A. Basak, S. Manhas, G. Kapil, S. Dasgupta, and N. Jain, "A Simulation Study of the Effect of Platinum Contact on CNT Based Gas Sensors Using Self-Consistent Field with NEGF Method," in Int. Conf. on Semiconductor Processes and Devices (SISPAD), USA, 2012.
- S. Maheshwaram, G. Kaushal, and S. Manhas, "A high performance vertical Si nanowire CMOS for ultra high density circuits," in Circuits and Systems (APCCAS), 2010 IEEE Asia Pacific Conference on, 2010, pp. 1219-1222.
Patents
- S K Manhas, S Nema, Dr A Bulusu, “A method of fabricating dual/asymmetric dielectric constant (dual-K) spacers in MOSFET,” No R20161028626, 2012 (filed), IIT Roorkee.
- S. K. Manhas, G. Kaushal, Anand Bulusu, “A Design Methodology using Extension Length (LEXT) Sizing in Nanowire CMOS Logic,” approved for filing by IP cell IIT Roorkee.
- Arvind KUMAR, Mahendra PAKALA, and Satendra Kumar GAUTAM, Sanjeev MANHAS, “DRAM AND METHOD OF MAKING,” No. 44015725US01, 2018 (Filed).
- Sandeep Chauhan, S K Manhas, Manish Joglekar, “CMOS Compatible Micro-machined Piezoelectric Energy Harvester.” Appl no 201911020224, 2019 (Filed).
