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News and Announcements
Surface Profiler
AMBiOS XP200 surface profiler

 

 A  stylus  scans  the  sample  surface at a programmable  speed, while  its position  is  sampled at  small and  regular  intervals. The data provide useful information such as surface roughness, waviness and step height  in a variety of applications with high sensitivity. Stylus profiler has a 6 inch stage, 55 mm max scan length and the max step down measurement is 800 µm with a min resolution step of 1 nm.